Translated title of the contribution | Conventional TEM Investigation of the FIB Damage in Copper |
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Original language | English |
Title of host publication | Microscopy Conference, International Forum for Advanced Microscopy |
Pages | 100-101 |
Publication status | Published - 2007 |
Conventional TEM Investigation of the FIB Damage in Copper
Daniel Kiener, Thomas Jörg, Martin Rester, Christian Motz, Gerhard Dehm
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution