Convolutional neural network for automated surface crack detection in inductive thermography

B. Oswald-Tranta, L. P. de Uralde Olavera, Eider Gorostegui-Colinas, Ph Westphal

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationThermosense
Subtitle of host publicationThermal Infrared Applications XLV
EditorsNicolas P. Avdelidis
PublisherSPIE
ISBN (Electronic)9781510661868
DOIs
Publication statusPublished - 2023
EventThermosense: Thermal Infrared Applications XLV 2023 - Orlando, United States
Duration: 2 May 20234 May 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12536
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceThermosense: Thermal Infrared Applications XLV 2023
Country/TerritoryUnited States
CityOrlando
Period2/05/234/05/23

Bibliographical note

Publisher Copyright:
© 2023 SPIE.

Keywords

  • computer tomography (CT)
  • convolutional neural network (CNN)
  • crack detection
  • deep learning
  • finite element simulation
  • Inductive thermography

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