Correlation of mechanical damage and electrical behavior of Al/Mo bilayers subjected to bending

Patrice Kreiml, Martin Rausch, Velislava L. Terziyska, Harald Köstenbauer, Jörg Winkler, Christian Mitterer, Megan J. Cordill

Research output: Contribution to journalArticleResearchpeer-review

5 Citations (Scopus)
Original languageEnglish
Article number137480
Number of pages9
JournalThin solid films
Issue number1 October
Early online date5 Aug 2019
Publication statusPublished - 1 Oct 2019


  • Aluminum
  • Bending
  • Electrical properties
  • Fracture
  • Molybdenum
  • Sputtering
  • Thin films

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