Critical thickness for GaN thin film on AlN substrate

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Translated title of the contribution	Critical thickness for GaN thin film on AlN substrate
Original language	English
Title of host publication	Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International
Pages	133-136
DOIs	https://doi.org/10.1109/IIRW.2013.6804177
Publication status	Published - 2013

Access to Document

@inproceedings{b1241c0559ae4f76bac82c4b76215b6c,

title = "Critical thickness for GaN thin film on AlN substrate",

author = "R.A. Coppeta and H Ceric and David Holec and T. Grasser",

year = "2013",

doi = "10.1109/IIRW.2013.6804177",

language = "English",

pages = "133--136",

booktitle = "Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International",

}