Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

J. Zalesak, M. Bartosik, R. Daniel, C. Mitterer, C. Krywka, D. Kiener, P. H. Mayrhofer, J. Keckes

Research output: Contribution to journalArticleResearchpeer-review

32 Citations (Scopus)
Original languageEnglish
Pages (from-to)212-219
Number of pages8
JournalActa materialia
Volume102
DOIs
Publication statusPublished - 2016

Keywords

  • Cantilevers
  • Gradient
  • Nano-mechanics
  • Thin film
  • X-ray nanodiffraction

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