Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

J. Zalesak; M. Bartosik; R. Daniel; C. Mitterer; C. Krywka; D. Kiener; P. H. Mayrhofer; J. Keckes

doi:10.1016/j.actamat.2015.09.007

Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

J. Zalesak
, M. Bartosik
, R. Daniel
, C. Mitterer
, C. Krywka
, D. Kiener
, P. H. Mayrhofer
, J. Keckes

Institute of Materials Science and Technology
University of Kiel and Helmholtz Zentrum Geesthacht
Materials Center Leoben Forschungs GmbH

Research output: Contribution to journal › Article › Research › peer-review

32 Citations (Scopus)

Original language	English
Pages (from-to)	212-219
Number of pages	8
Journal	Acta materialia
Volume	102
DOIs	https://doi.org/10.1016/j.actamat.2015.09.007
Publication status	Published - 2016

Keywords

Cantilevers
Gradient
Nano-mechanics
Thin film
X-ray nanodiffraction

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10.1016/j.actamat.2015.09.007

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84942694249&doi=10.1016%2fj.actamat.2015.09.007&partnerID=40&md5=f308cbf6cfbe2478c19b1db17d1dccb9

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title = "Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film",

keywords = "Cantilevers, Gradient, Nano-mechanics, Thin film, X-ray nanodiffraction",

author = "J. Zalesak and M. Bartosik and R. Daniel and C. Mitterer and C. Krywka and D. Kiener and Mayrhofer, \{P. H.\} and J. Keckes",

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T1 - Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

AU - Zalesak, J.

AU - Bartosik, M.

AU - Daniel, R.

AU - Mitterer, C.

AU - Krywka, C.

AU - Kiener, D.

AU - Mayrhofer, P. H.

AU - Keckes, J.

N1 - cited By 3

PY - 2016

Y1 - 2016

KW - Cantilevers

KW - Gradient

KW - Nano-mechanics

KW - Thin film

KW - X-ray nanodiffraction

UR - https://www.scopus.com/pages/publications/84942694249

U2 - 10.1016/j.actamat.2015.09.007

DO - 10.1016/j.actamat.2015.09.007

M3 - Article

AN - SCOPUS:84942694249

SN - 1359-6454

VL - 102

SP - 212

EP - 219

JO - Acta materialia

JF - Acta materialia

ER -

Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film

Keywords

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