Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film

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Translated title of the contribution	Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film
Original language	English
Pages (from-to)	1-4
Journal	Thin solid films
Volume	542
DOIs	https://doi.org/10.1016/j.tsf.2013.05.102
Publication status	Published - 2013

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@article{c809485d7bfc48f193b6e7414c7eadbd,

title = "Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film",

author = "Matthias Bartosik and Rostislav Daniel and Christian Mitterer and I. Matko and M. Burghammer and P.H. Mayrhofer and Jozef Keckes",

year = "2013",

doi = "10.1016/j.tsf.2013.05.102",

language = "English",

volume = "542",

pages = "1--4",

journal = "Thin solid films",

issn = "0040-6090",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNx thin film

AU - Bartosik, Matthias

AU - Daniel, Rostislav

AU - Mitterer, Christian

AU - Matko, I.

AU - Burghammer, M.

AU - Mayrhofer, P.H.

AU - Keckes, Jozef

PY - 2013

Y1 - 2013

U2 - 10.1016/j.tsf.2013.05.102

DO - 10.1016/j.tsf.2013.05.102

M3 - Article

SN - 0040-6090

VL - 542

SP - 1

EP - 4

JO - Thin solid films

JF - Thin solid films

ER -