Abstract
In-situ X-ray diffraction was applied to isotactic polypropylene with a high volume fraction of α-phase (α-iPP) while it has been compressed at temperatures below and above its glass transition temperature Tg. The diffraction patterns were evaluated by the Multi-reflection X-ray Profile Analysis (MXPA) method, revealing microstructural parameters such as the density of dislocations and the size of coherently scattering domains (CSD-size). A significant difference in the development of the dislocation density was found compared to compression at temperatures above Tg, pointing at a different plastic deformation mechanism at these temperatures. Based on the individual evolutions of the dislocation density and CSD-size observed as a function of compressive strain, suggestions for the deformation mechanisms occurring below and above Tg are made.
| Original language | English |
|---|---|
| Pages (from-to) | 894-900 |
| Number of pages | 7 |
| Journal | Express Polymer Letters |
| Volume | 9.2015 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - Aug 2015 |
| Externally published | Yes |
Keywords
- Dislocation
- Plasticity
- Polypropylene
- Thermal properties
- X-ray diffraction
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