Defect induced shortening of excess carrier lifetime in single period nipi structures

Gerhard Span, Josef Oswald, Gernot Heigl

Research output: Contribution to journal › Article › Research › peer-review

Translated title of the contribution	Defect induced shortening of excess carrier lifetime in single period nipi structures
Original language	English
Pages (from-to)	1307-1313
Journal	Materials science and technology
Volume	14
Publication status	Published - 1998

Cite this

@article{d7c217fc790d4690ba03e9bfa1c50b57,

title = "Defect induced shortening of excess carrier lifetime in single period nipi structures",

author = "Gerhard Span and Josef Oswald and Gernot Heigl",

year = "1998",

language = "English",

volume = "14",

pages = "1307--1313",

journal = "Materials science and technology",

issn = "0267-0836",

publisher = "Maney Publishing",

}