Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling

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Translated title of the contribution	Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling
Original language	English
Pages (from-to)	23902-1-23902-5
Journal	European physical journal, The / Applied physics : EPJ
Volume	55
DOIs	https://doi.org/10.1051/epjap/2011100428
Publication status	Published - 2011

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@article{e1e34b7f5d42440b90eea83deafb7a65,

title = "Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling",

author = "Stefan Lorbek and Christian Teichert and Gregor Hlawacek",

year = "2011",

doi = "10.1051/epjap/2011100428",

language = "English",

volume = "55",

pages = "23902--1--23902--5",

journal = "European physical journal, The / Applied physics : EPJ",

issn = "1286-0042",

publisher = "EDP Sciences",

}

TY - JOUR

T1 - Determination of critical island size in para-sexiphenyl islands on SiO2 using capture-zone scaling

AU - Lorbek, Stefan

AU - Teichert, Christian

AU - Hlawacek, Gregor

PY - 2011

Y1 - 2011

U2 - 10.1051/epjap/2011100428

DO - 10.1051/epjap/2011100428

M3 - Article

SN - 1286-0042

VL - 55

SP - 23902-1-23902-5

JO - European physical journal, The / Applied physics : EPJ

JF - European physical journal, The / Applied physics : EPJ

ER -