Dislocation storage in single slip oriented Cu micro-tensile samples: New insights by X-ray microdiffraction

Christoph Kirchlechner, Daniel Kiener, Christian Motz, S. Labat, N. Vaxelaire, O. Perroud, J.-S. Micha, O. Ulrich, O. Thomas, Gerhard Dehm, Jozef Keckes

Research output: Contribution to journalArticleResearchpeer-review

38 Citations (Scopus)
Translated title of the contributionDislocation storage in single slip oriented Cu micro-tensile samples: New insights by X-ray microdiffraction
Original languageEnglish
Pages (from-to)1256-1264
JournalPhilosophical magazine
Volume91
DOIs
Publication statusPublished - 2011

Cite this