Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy

Quan Shen; Gregor Hlawacek; Markus Kratzer; Heinz-Georg Flesch; Thomas Potocar; Roland Resel; Adolf Winkler; Christian Teichert

Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy

Quan Shen, Gregor Hlawacek, Markus Kratzer, Heinz-Georg Flesch, Thomas Potocar, Roland Resel, Adolf Winkler, Christian Teichert

Chair of Physics (460)

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Original language	English
Publication status	Published - 2010
Event	International Workshop on In situ characterization of near-surface processes - Eisenerz, Austria Duration: 30 May 2010 → 3 Jun 2010

Conference

Conference	International Workshop on In situ characterization of near-surface processes
Country/Territory	Austria
City	Eisenerz
Period	30/05/10 → 3/06/10

Cite this

@conference{f0440aa017df4616862a019cbd6a5be6,

title = "Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy",

author = "Quan Shen and Gregor Hlawacek and Markus Kratzer and Heinz-Georg Flesch and Thomas Potocar and Roland Resel and Adolf Winkler and Christian Teichert",

year = "2010",

language = "English",

note = "International Workshop on In situ characterization of near-surface processes ; Conference date: 30-05-2010 Through 03-06-2010",

}

Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy. / Shen, Quan; Hlawacek, Gregor; Kratzer, Markus et al.
2010. Poster session presented at International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria.

Research output: Contribution to conference › Poster › Research › peer-review

TY - CONF

T1 - Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy

AU - Shen, Quan

AU - Hlawacek, Gregor

AU - Kratzer, Markus

AU - Flesch, Heinz-Georg

AU - Potocar, Thomas

AU - Resel, Roland

AU - Winkler, Adolf

AU - Teichert, Christian

PY - 2010

Y1 - 2010

M3 - Poster

T2 - International Workshop on In situ characterization of near-surface processes

Y2 - 30 May 2010 through 3 June 2010

ER -