| Original language | English |
|---|---|
| Article number | 022201 |
| Number of pages | 11 |
| Journal | Journal of vacuum science & technology / B (JVST) |
| Volume | 35.2017 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 9 Feb 2017 |
Effect of growth conditions on interface stability and thermophysical properties of sputtered Cu films on Si with and without WTi barrier layers
Imane Souli, Velislava Terziyska, Jozef Keckes, Werner Robl, Johannes Zechner, Christian Mitterer
Research output: Contribution to journal › Article › Research › peer-review
5
Citations
(Scopus)