Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy

Martin Schloffer, Christian Teichert, Peter Supancic, Andrei Andreev, Yue Hou, Zhonghua Wang

Research output: Contribution to journal › Article › Research › peer-review

11 Citations (Scopus)

Translated title of the contribution	Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy
Original language	English
Pages (from-to)	1761-1764
Journal	Journal of the European Ceramic Society
Volume	30
DOIs	https://doi.org/10.1016/j.jeurceramsoc.2010.01.005
Publication status	Published - 2010

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title = "Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy",

author = "Martin Schloffer and Christian Teichert and Peter Supancic and Andrei Andreev and Yue Hou and Zhonghua Wang",

year = "2010",

doi = "10.1016/j.jeurceramsoc.2010.01.005",

language = "English",

volume = "30",

pages = "1761--1764",

journal = "Journal of the European Ceramic Society",

issn = "0955-2219",

publisher = "Elsevier",

}

TY - JOUR

T1 - Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy

AU - Schloffer, Martin

AU - Teichert, Christian

AU - Supancic, Peter

AU - Andreev, Andrei

AU - Hou, Yue

AU - Wang, Zhonghua

PY - 2010

Y1 - 2010

U2 - 10.1016/j.jeurceramsoc.2010.01.005

DO - 10.1016/j.jeurceramsoc.2010.01.005

M3 - Article

SN - 0955-2219

VL - 30

SP - 1761

EP - 1764

JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

ER -