Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique

Igor Beinik; Markus Kratzer; Christian Teichert; Gerhard Brauer; Wolfgang Anwand; Xinyi Chen; Y. F. Hsu; Aleksandra B. Djurišić

Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique

Igor Beinik, Markus Kratzer, Christian Teichert, Gerhard Brauer, Wolfgang Anwand, Xinyi Chen, Y. F. Hsu, Aleksandra B. Djurišić

Chair of Physics (460)

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique
Original language	English
Publication status	Published - 2010
Event	International Workshop on In situ characterization of near-surface processes - Eisenerz, Austria Duration: 30 May 2010 → 3 Jun 2010

Conference

Conference	International Workshop on In situ characterization of near-surface processes
Country/Territory	Austria
City	Eisenerz
Period	30/05/10 → 3/06/10

Cite this

@conference{656b7e6198a5403b8a6f8dcca393223d,

title = "Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique",

author = "Igor Beinik and Markus Kratzer and Christian Teichert and Gerhard Brauer and Wolfgang Anwand and Xinyi Chen and Hsu, {Y. F.} and Djuri{\v s}i{\'c}, {Aleksandra B.}",

year = "2010",

language = "English",

note = "International Workshop on In situ characterization of near-surface processes ; Conference date: 30-05-2010 Through 03-06-2010",

}

Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique. / Beinik, Igor; Kratzer, Markus ; Teichert, Christian et al.
2010. Poster session presented at International Workshop on In situ characterization of near-surface processes, Eisenerz, Austria.

Research output: Contribution to conference › Poster › Research › peer-review

TY - CONF

T1 - Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique

AU - Beinik, Igor

AU - Kratzer, Markus

AU - Teichert, Christian

AU - Brauer, Gerhard

AU - Anwand, Wolfgang

AU - Chen, Xinyi

AU - Hsu, Y. F.

AU - Djurišić, Aleksandra B.

PY - 2010

Y1 - 2010

M3 - Poster

T2 - International Workshop on In situ characterization of near-surface processes

Y2 - 30 May 2010 through 3 June 2010

ER -