Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

Igor Beinik, Markus Kratzer, Astrid Wachauer, Lin Wang, Rainer Lechner, Christian Teichert, Christian Motz, W. Anwand, Gerhard Brauer, Xinyi Chen, Y. F. Hsu, A. Djuricis

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40 Citations (Scopus)
Translated title of the contributionElectrical properties of ZnO nanorods studied by conductive atomic force microscopy
Original languageEnglish
Pages (from-to)052005-1-052005-7
JournalJournal of applied physics
Volume110
DOIs
Publication statusPublished - 2011

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