Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

Igor Beinik; Markus Kratzer; Astrid Wachauer; Lin Wang; Rainer Lechner; Christian Teichert; Christian Motz; W. Anwand; Gerhard Brauer; Xin Yi Chen; Yuk Fan Hsu; Aleksandra B. Djurišić

doi:10.1063/1.4758293

Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

Igor Beinik, Markus Kratzer, Astrid Wachauer, Lin Wang, Rainer Lechner, Christian Teichert, Christian Motz, W. Anwand, Gerhard Brauer, Xin Yi Chen, Yuk Fan Hsu, Aleksandra B. Djurišić

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English
Article number	079903
Number of pages	1
Journal	Journal of applied physics
Volume	112.2012
Issue number	7
DOIs	https://doi.org/10.1063/1.4758293
Publication status	Published - 1 Oct 2012

Access to Document

10.1063/1.4758293

Cite this

Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X. Y., Hsu, Y. F., & Djurišić, A. B. (2012). Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)). Journal of applied physics, 112.2012(7), Article 079903. https://doi.org/10.1063/1.4758293

@article{35b3d105f5974687b0939d6b7c6ee80b,

title = "Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))",

author = "Igor Beinik and Markus Kratzer and Astrid Wachauer and Lin Wang and Rainer Lechner and Christian Teichert and Christian Motz and W. Anwand and Gerhard Brauer and Chen, {Xin Yi} and Hsu, {Yuk Fan} and Djuri{\v s}i{\'c}, {Aleksandra B.}",

year = "2012",

month = oct,

day = "1",

doi = "10.1063/1.4758293",

language = "English",

volume = "112.2012",

journal = "Journal of applied physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "7",

}

Beinik, I, Kratzer, M, Wachauer, A, Wang, L, Lechner, R , Teichert, C, Motz, C, Anwand, W, Brauer, G, Chen, XY, Hsu, YF & Djurišić, AB 2012, 'Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))', Journal of applied physics, vol. 112.2012, no. 7, 079903. https://doi.org/10.1063/1.4758293

TY - JOUR

T1 - Erratum

T2 - Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

AU - Beinik, Igor

AU - Kratzer, Markus

AU - Wachauer, Astrid

AU - Wang, Lin

AU - Lechner, Rainer

AU - Teichert, Christian

AU - Motz, Christian

AU - Anwand, W.

AU - Brauer, Gerhard

AU - Chen, Xin Yi

AU - Hsu, Yuk Fan

AU - Djurišić, Aleksandra B.

PY - 2012/10/1

Y1 - 2012/10/1

UR - http://www.scopus.com/inward/record.url?scp=84867523502&partnerID=8YFLogxK

U2 - 10.1063/1.4758293

DO - 10.1063/1.4758293

M3 - Comment/debate

AN - SCOPUS:84867523502

SN - 0021-8979

VL - 112.2012

JO - Journal of applied physics

JF - Journal of applied physics

IS - 7

M1 - 079903

ER -

Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))

Access to Document

Other files and links

Cite this