Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100)

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Translated title of the contribution	Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100)
Original language	English
Pages (from-to)	367-371
Journal	Powder diffraction
Volume	19
Publication status	Published - 2004

Cite this

@article{f3db9839478f42fc8dbd6c2ac3b96f89,

title = "Evaluation of experimental stress-strain dependence in thermally cycled Al thin film on Si(100)",

author = "Jozef Keckes and Martin Hafok and Ernst Eiper and A. Hofer and R. Resel and C. Eisenmenger-Sittner",

year = "2004",

language = "English",

volume = "19",

pages = "367--371",

journal = "Powder diffraction",

issn = "0885-7156",

publisher = "Cambridge University Press",

}