Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy

Quan Shen, Matthias Edler, Thomas Grießer, Astrid-Caroline Knall, Gregor Trimmel, Wolfgang Kern, Christian Teichert

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Translated title of the contribution	Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy
Original language	English
Pages (from-to)	590-598
Journal	Scanning
Volume	36
DOIs	https://doi.org/10.1002/sca.21159
Publication status	Published - 2014

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title = "Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy",

author = "Quan Shen and Matthias Edler and Thomas Grie{\ss}er and Astrid-Caroline Knall and Gregor Trimmel and Wolfgang Kern and Christian Teichert",

year = "2014",

doi = "10.1002/sca.21159",

language = "English",

volume = "36",

pages = "590--598",

journal = "Scanning",

issn = "0161-0457",

publisher = "John Wiley & Sons, USA",

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TY - JOUR

T1 - Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy

AU - Shen, Quan

AU - Edler, Matthias

AU - Grießer, Thomas

AU - Knall, Astrid-Caroline

AU - Trimmel, Gregor

AU - Kern, Wolfgang

AU - Teichert, Christian

PY - 2014

Y1 - 2014

U2 - 10.1002/sca.21159

DO - 10.1002/sca.21159

M3 - Article

SN - 0161-0457

VL - 36

SP - 590

EP - 598

JO - Scanning

JF - Scanning

ER -