FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior

Subin Lee, Jiwon Jeong, Youbin Kim, Seung Min Han, Daniel Kiener, Sang Ho Oh

Research output: Contribution to journalArticleResearchpeer-review

48 Citations (Scopus)
Original languageEnglish
Pages (from-to)283-294
Number of pages12
JournalActa materialia
Issue number15 May
Publication statusE-pub ahead of print - 24 Mar 2016


  • Aluminum
  • Annealing
  • Dislocations
  • Focused ion beam
  • In-situ transmission electron microscopy
  • Slip bursts

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