FIB-induced dislocations in Al submicron pillars: Annihilation by thermal annealing and effects on deformation behavior

  • Subin Lee
  • , Jiwon Jeong
  • , Youbin Kim
  • , Seung Min Han
  • , Daniel Kiener
  • , Sang Ho Oh

Research output: Contribution to journalArticleResearchpeer-review

48 Citations (Scopus)
Original languageEnglish
Pages (from-to)283-294
Number of pages12
JournalActa materialia
Volume110.2016
Issue number15 May
DOIs
Publication statusE-pub ahead of print - 24 Mar 2016

Keywords

  • Aluminum
  • Annealing
  • Dislocations
  • Focused ion beam
  • In-situ transmission electron microscopy
  • Slip bursts

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