Abstract
Resonant magnetic soft x-ray and neutron diffraction were used to analyze the thickness dependence of the helical antiferromagnetic (AFM) ordering temperature TN for thin Ho metal films. TN was found to decrease with film thickness d, in contrast with the Curie temperature of ferromagnets. Mean-field calculations were used to reproduce the observations that suggest a linear relationship between d0 and Lb in long-period antiferromagnets. The results show that d0 agree closely with the bulk AFM period Lb in Ho metal.
| Original language | English |
|---|---|
| Article number | 157204 |
| Number of pages | 4 |
| Journal | Physical review letters |
| Volume | 2004 |
| Issue number | Volume 93, Issue 15 |
| DOIs | |
| Publication status | Published - 5 Oct 2004 |
| Externally published | Yes |
Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver