fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy

Michael Tkadletz, Maximilian Schiester, Helene Waldl, Georg Schusser, Michael Krause, Nina Schalk

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)1-6
JournalMaterials Today Communications
Volume2024
Issue number39
DOIs
Publication statusPublished - 2024

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