| Original language | English |
|---|---|
| Pages (from-to) | 616-623 |
| Journal | Acta materialia |
| Volume | 103 |
| DOIs | |
| Publication status | Published - 2016 |
High resolution determination of local residual stress gradients in single- and multilayer thin film systems
- Ruth Treml
- , Darian Kozic
- , Johannes Zechner
- , Xavier Maeder
- , Hans-Peter Gänser
- , Ronald Schöngrundner
- , Johann Michler
- , Roland Brunner
- , Daniel Kiener
Research output: Contribution to journal › Article › Research › peer-review
43
Citations
(Scopus)