Imaging dislocations in gallium nitride across broad areas using atomic force microscopy

S.E. Bennett, David Holec, M.J. Kappers, C.J. Humphreys, R.A. Oliver

Research output: Contribution to journal › Article › Research › peer-review

7 Citations (Scopus)

Translated title of the contribution	Imaging dislocations in gallium nitride across broad areas using atomic force microscopy
Original language	English
Pages (from-to)	0637011-0637017
Journal	Review of scientific instruments
DOIs	https://doi.org/10.1063/1.3430539
Publication status	Published - 2010

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@article{30787dda3db64e09848c306cbecbfe25,

title = "Imaging dislocations in gallium nitride across broad areas using atomic force microscopy",

author = "S.E. Bennett and David Holec and M.J. Kappers and C.J. Humphreys and R.A. Oliver",

year = "2010",

doi = "10.1063/1.3430539",

language = "English",

pages = "0637011--0637017",

journal = "Review of scientific instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - Imaging dislocations in gallium nitride across broad areas using atomic force microscopy

AU - Bennett, S.E.

AU - Holec, David

AU - Kappers, M.J.

AU - Humphreys, C.J.

AU - Oliver, R.A.

PY - 2010

Y1 - 2010

U2 - 10.1063/1.3430539

DO - 10.1063/1.3430539

M3 - Article

SN - 0034-6748

SP - 637011

EP - 637017

JO - Review of scientific instruments

JF - Review of scientific instruments

ER -