Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism

  • Gregor Hlawacek
  • , Vasilisa Veligura
  • , Stefan Lorbek
  • , Tijs F. Mocking
  • , Antony George
  • , Raoul van Gastel
  • , Harold J. W. Zandvliet
  • , Bene Poelsema

Research output: Contribution to journalArticleResearchpeer-review

31 Citations (Scopus)
Translated title of the contributionImaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism
Original languageEnglish
Pages (from-to)507-512
JournalBeilstein journal of nanotechnology
Volume3
DOIs
Publication statusPublished - 2012

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