In situ µLaue: Instrumental setup for the deformation of micron sized samples

Christoph Kirchlechner, Jozef Keckes, Jean-Sebastien Micha, Gerhard Dehm

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Translated title of the contribution	In situ µLaue: Instrumental setup for the deformation of micron sized samples
Original language	English
Pages (from-to)	837-844
Journal	Advanced engineering materials
Volume	13
DOIs	https://doi.org/10.1002/adem.201000286
Publication status	Published - 2011

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title = "In situ µLaue: Instrumental setup for the deformation of micron sized samples",

author = "Christoph Kirchlechner and Jozef Keckes and Jean-Sebastien Micha and Gerhard Dehm",

year = "2011",

doi = "10.1002/adem.201000286",

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pages = "837--844",

journal = " Advanced engineering materials",

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T1 - In situ µLaue: Instrumental setup for the deformation of micron sized samples

AU - Kirchlechner, Christoph

AU - Keckes, Jozef

AU - Micha, Jean-Sebastien

AU - Dehm, Gerhard

PY - 2011

Y1 - 2011

U2 - 10.1002/adem.201000286

DO - 10.1002/adem.201000286

M3 - Article

SN - 1438-1656

VL - 13

SP - 837

EP - 844

JO - Advanced engineering materials

JF - Advanced engineering materials

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