Abstract
Konferenzort: Leoben
Konferenzdatum: 02.10.09
Konferenzdatum: 02.10.09
| Original language | English |
|---|---|
| Publisher | Eigenverlag |
| Publication status | Published - 2009 |
In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)
Christian Teichert (Editor)
Research output: Book/Report › Anthology › Research