In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings

M. Bartosik, R. Pitonak, Jozef Keckes

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13 Citations (Scopus)

Translated title of the contribution	In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings
Original language	English
Pages (from-to)	705-711
Journal	Advanced engineering materials
Publication status	Published - 2011

Cite this

@article{0de865f9ba47427093651136baad4343,

title = "In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings",

author = "M. Bartosik and R. Pitonak and Jozef Keckes",

year = "2011",

language = "English",

pages = "705--711",

journal = " Advanced engineering materials",

issn = "1438-1656",

publisher = "Wiley-VCH ",

}