In-Situ Synchrotron Profile Analysis after High-Pressure Torsion Deformation

Michael Kerber; Florian Spieckermann; Roman Schuster; Bertalan Joni; Norbert Schell; Erhard Schafler

doi:10.3390/cryst9050232

In-Situ Synchrotron Profile Analysis after High-Pressure Torsion Deformation

Michael Kerber
, Florian Spieckermann
, Roman Schuster
, Bertalan Joni
, Norbert Schell
, Erhard Schafler

Chair of Materials Physics (430)

Universität Wien
Eötvös University Budapest
Photon Science, Deutsches Elektronen-Synchrotron DESY, Hamburg,

Research output: Contribution to journal › Article › Research › peer-review

7 Citations (Scopus)

Original language	English
Article number	232
Journal	Crystals
Volume	9.2019
Issue number	5
DOIs	https://doi.org/10.3390/cryst9050232
Publication status	Published - 1 May 2019

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title = "In-Situ Synchrotron Profile Analysis after High-Pressure Torsion Deformation",

author = "Michael Kerber and Florian Spieckermann and Roman Schuster and Bertalan Joni and Norbert Schell and Erhard Schafler",

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AU - Kerber, Michael

AU - Spieckermann, Florian

AU - Schuster, Roman

AU - Joni, Bertalan

AU - Schell, Norbert

AU - Schafler, Erhard

PY - 2019/5/1

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VL - 9.2019

JO - Crystals

JF - Crystals

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In-Situ Synchrotron Profile Analysis after High-Pressure Torsion Deformation

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