In-situ TEM investigation of toughening in Silicon at small scales

Inas Issa, Christoph Gammer, Stefan Kolitsch, Anton Hohenwarter, Peter J. Imrich, Reinhard Pippan, Daniel Kiener

Research output: Contribution to journalArticleResearchpeer-review

60 Downloads (Pure)
Original languageEnglish
Pages (from-to)29-37
Number of pages9
JournalMaterials today
Volume48
Issue number48
Early online date3 Jul 2021
DOIs
Publication statusPublished - Sept 2021

Bibliographical note

Publisher Copyright:
© 2021 The Author(s)

Keywords

  • Brittle Ductile Transition (BDT)
  • Fracture toughness
  • In-situ TEM
  • Nanoscale fracture experiments
  • Single crystal (SC) Silicon (Si)
  • Size scale effect
  • Toughening

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