In-situ TEM investigation of toughening in Silicon at small scales

Inas Issa; Christoph Gammer; Stefan Kolitsch; Anton Hohenwarter; Peter J. Imrich; Reinhard Pippan; Daniel Kiener

doi:10.1016/j.mattod.2021.03.009

In-situ TEM investigation of toughening in Silicon at small scales

Inas Issa
, Christoph Gammer
, Stefan Kolitsch
, Anton Hohenwarter
, Peter J. Imrich
, Reinhard Pippan
, Daniel Kiener

Erich Schmid Institute of Materials Science
Materials Center Leoben Forschungs GmbH
Infineon Technologies AG Austria

Research output: Contribution to journal › Article › Research › peer-review

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Original language	English
Pages (from-to)	29-37
Number of pages	9
Journal	Materials today
Volume	48
Issue number	48
Early online date	3 Jul 2021
DOIs	https://doi.org/10.1016/j.mattod.2021.03.009
Publication status	Published - Sept 2021

Bibliographical note

Publisher Copyright:
© 2021 The Author(s)

Keywords

Brittle Ductile Transition (BDT)
Fracture toughness
In-situ TEM
Nanoscale fracture experiments
Single crystal (SC) Silicon (Si)
Size scale effect
Toughening

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10.1016/j.mattod.2021.03.009

I. Issa, C. Gammer, S. Kolitsch, A. Hohenwarter, P.J. Imrich, R. Pippan, D. Kiener 2021 (Mater Today, online)Proof, 1.86 MBLicence: CC BY

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@article{215440bb270a4a8a97c282bf34c45b54,

title = "In-situ TEM investigation of toughening in Silicon at small scales",

keywords = "Brittle Ductile Transition (BDT), Fracture toughness, In-situ TEM, Nanoscale fracture experiments, Single crystal (SC) Silicon (Si), Size scale effect, Toughening",

author = "Inas Issa and Christoph Gammer and Stefan Kolitsch and Anton Hohenwarter and Imrich, \{Peter J.\} and Reinhard Pippan and Daniel Kiener",

note = "Publisher Copyright: {\textcopyright} 2021 The Author(s)",

year = "2021",

month = sep,

doi = "10.1016/j.mattod.2021.03.009",

language = "English",

volume = "48",

pages = "29--37",

journal = "Materials today",

issn = "1369-7021",

publisher = "Elsevier B.V.",

number = "48",

}

TY - JOUR

T1 - In-situ TEM investigation of toughening in Silicon at small scales

AU - Issa, Inas

AU - Gammer, Christoph

AU - Kolitsch, Stefan

AU - Hohenwarter, Anton

AU - Imrich, Peter J.

AU - Pippan, Reinhard

AU - Kiener, Daniel

PY - 2021/9

Y1 - 2021/9

KW - Brittle Ductile Transition (BDT)

KW - Fracture toughness

KW - In-situ TEM

KW - Nanoscale fracture experiments

KW - Single crystal (SC) Silicon (Si)

KW - Size scale effect

KW - Toughening

UR - https://www.scopus.com/pages/publications/85109089641

U2 - 10.1016/j.mattod.2021.03.009

DO - 10.1016/j.mattod.2021.03.009

M3 - Article

AN - SCOPUS:85109089641

SN - 1369-7021

VL - 48

SP - 29

EP - 37

JO - Materials today

JF - Materials today

IS - 48

ER -

In-situ TEM investigation of toughening in Silicon at small scales

Bibliographical note

Keywords

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