Inspection of short surface cracks by inductive thermography and by computer tomography

B. Oswald-Tranta, A. Hackl, E. Gorostegui-Colinas, A. Muniategui Merino, Ph Westphal

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationThermosense
Subtitle of host publicationThermal Infrared Applications XLVI
EditorsFernando Lopez, Nicolas P. Avdelidis, Giovanni Ferrarini
PublisherSPIE
ISBN (Electronic)9781510674127
DOIs
Publication statusPublished - 2024
EventThermosense: Thermal Infrared Applications XLVI - National Harbor, United States
Duration: 22 Apr 202425 Apr 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13047
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceThermosense: Thermal Infrared Applications XLVI
Country/TerritoryUnited States
CityNational Harbor
Period22/04/2425/04/24

Bibliographical note

Publisher Copyright:
© 2024 SPIE.

Keywords

  • computer tomography(CT)
  • crack characterization
  • crack detection
  • finite element simulation
  • fluorescent penetrant test(FPT)
  • Inductive thermography

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