@article{1948eadd17344ee4a562ff58f577a268,
title = "Investigation of high cyclic fatigue behaviour of thin copper films using MEMS structure",
keywords = "Electronic material, High cycle fatigue, MEMS, Microstructures, Reliability",
author = "F. Saghaeian and M. Lederer and A. Hofer and J. Todt and J. Keckes and G. Khatibi",
year = "2019",
month = jul,
day = "19",
doi = "10.1016/j.ijfatigue.2019.06.039",
language = "English",
volume = "128.2019",
journal = "International Journal of Fatigue",
issn = "0142-1123",
publisher = "Elsevier Ltd",
number = "November",
}