Investigation of the fatigue behavior of Al thin films with different microstructure

Gerhard Dehm, Walther Heinz, Reinhard Pippan

Research output: Contribution to journalArticleResearchpeer-review

30 Citations (Scopus)
Translated title of the contributionInvestigation of the fatigue behavior of Al thin films with different microstructure
Original languageEnglish
Pages (from-to)7757-7763
JournalMaterials science and engineering: A, Structural materials: properties, microstructure and processing
Publication statusPublished - 2010

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