Laser Ultrasonic Thin Film Characterization of Si-Cu-Al-Cu Multi-Layered Stacks

Eva Grünwald, Robert Nuster, Günther Paltauf, Thomas Maier, Robert Wimmer-Teubenbacher, Ruth Konetschnik, Daniel Kiener, Verena Leitgeb, Anton Köck, Roland Brunner

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)7122-7127
Number of pages6
JournalMaterials Today: Proceedings
Issue number7, Part 2
Publication statusE-pub ahead of print - 19 Sept 2017


  • Laser Ultrasound
  • Multi-Layered Systems
  • Stack Charakterization
  • Thin Film Characterization

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