Laser Ultrasonic Thin Film Characterization of Si-Cu-Al-Cu Multi-Layered Stacks

  • Eva Grünwald
  • , Robert Nuster
  • , Günther Paltauf
  • , Thomas Maier
  • , Robert Wimmer-Teubenbacher
  • , Ruth Konetschnik
  • , Daniel Kiener
  • , Verena Leitgeb
  • , Anton Köck
  • , Roland Brunner

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)7122-7127
Number of pages6
JournalMaterials Today: Proceedings
Volume4.2017
Issue number7, Part 2
DOIs
Publication statusE-pub ahead of print - 19 Sept 2017

Keywords

  • Laser Ultrasound
  • Multi-Layered Systems
  • Stack Charakterization
  • Thin Film Characterization

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