Leitfähigkeits-Rasterkraftmikroskopie (C-AFM)

Translated title of the contribution: Leitfähigkeits-Rasterkraftmikroskopie (C-AFM)

Christian Teichert, Sascha Kremmer

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research

Translated title of the contributionLeitfähigkeits-Rasterkraftmikroskopie (C-AFM)
Original languageGerman
Title of host publicationHandbuch der Nanoanalytik
Pages50-51
Publication statusPublished - 2005

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