Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

Sergey V. Kondratenko, V. S. Lysenko, Yury N. Kozyrev, Markus Kratzer, D. P. Storozhuk, S. A. Iliash, Caterina Marina Czibula, Christian Teichert

Research output: Contribution to journalArticleResearchpeer-review

8 Citations (Scopus)
Original languageEnglish
Pages (from-to)783-789
Number of pages7
JournalApplied surface science
Volume389.2016
Issue number15 December
DOIs
Publication statusPublished - 15 Dec 2016

Keywords

  • Carrier lifetime
  • Heterostructures
  • Quantum dots
  • Recombination processes

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