Magnetic depth profiles from resonant soft x-ray scattering: Application to Dy thin films

Holger Ott; C. Schüßler-Langeheine; E. Schierle; G. Kaindl; E. Weschke

doi:10.1063/1.2206699

Magnetic depth profiles from resonant soft x-ray scattering: Application to Dy thin films

Holger Ott
, C. Schüßler-Langeheine
, E. Schierle
, G. Kaindl
, E. Weschke

Freie Universität Berlin

Research output: Contribution to journal › Article › Research › peer-review

Abstract

We employ the strong variation of the photon penetration depth across an electronic resonance in soft x-ray scattering for a depth resolved study of an antiferromagnetic (AFM) thin film. We directly observed the development of the helical AFM structure in thin Dy(001) films on W(110) across the temperature-induced phase transition from ferromagnetic to helical AFM order.

Original language	English
Article number	212507
Journal	Applied physics letters
Volume	2006
Issue number	Volume 88, Issue 21
DOIs	https://doi.org/10.1063/1.2206699
Publication status	Published - 21 May 2006
Externally published	Yes

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abstract = "We employ the strong variation of the photon penetration depth across an electronic resonance in soft x-ray scattering for a depth resolved study of an antiferromagnetic (AFM) thin film. We directly observed the development of the helical AFM structure in thin Dy(001) films on W(110) across the temperature-induced phase transition from ferromagnetic to helical AFM order.",

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AU - Schierle, E.

AU - Kaindl, G.

AU - Weschke, E.

PY - 2006/5/21

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N2 - We employ the strong variation of the photon penetration depth across an electronic resonance in soft x-ray scattering for a depth resolved study of an antiferromagnetic (AFM) thin film. We directly observed the development of the helical AFM structure in thin Dy(001) films on W(110) across the temperature-induced phase transition from ferromagnetic to helical AFM order.

AB - We employ the strong variation of the photon penetration depth across an electronic resonance in soft x-ray scattering for a depth resolved study of an antiferromagnetic (AFM) thin film. We directly observed the development of the helical AFM structure in thin Dy(001) films on W(110) across the temperature-induced phase transition from ferromagnetic to helical AFM order.

UR - https://www.scopus.com/pages/publications/33744522435

U2 - 10.1063/1.2206699

DO - 10.1063/1.2206699

M3 - Article

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VL - 2006

JO - Applied physics letters

JF - Applied physics letters

IS - Volume 88, Issue 21

M1 - 212507

ER -

Magnetic depth profiles from resonant soft x-ray scattering: Application to Dy thin films

Abstract

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