Mechanical Testing of Micron and Sub-Micron Samples Using In-Situ Electron Microscopy

Daniel Kiener

Mechanical Testing of Micron and Sub-Micron Samples Using In-Situ Electron Microscopy

Daniel Kiener

Chair of Materials Physics (430)

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research

Original language	English
Title of host publication	DETERMINATION OF MECHANICAL PROPERTIES OF MATERIALS BY SMALL PUNCH AND OTHER MINIATURE TESTING TECHNIQUES, 2ND INTERNATIONAL CONFERENCE SSTT
Pages	239-244
Publication status	Published - 2012

Cite this

@inbook{ce98c1b3350e46019ad749621c6a794e,

title = "Mechanical Testing of Micron and Sub-Micron Samples Using In-Situ Electron Microscopy",

author = "Daniel Kiener",

year = "2012",

language = "English",

isbn = "978-80-260-0079-2",

pages = "239--244",

booktitle = "DETERMINATION OF MECHANICAL PROPERTIES OF MATERIALS BY SMALL PUNCH AND OTHER MINIATURE TESTING TECHNIQUES, 2ND INTERNATIONAL CONFERENCE SSTT",

}