MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing

Roland Schmidt; Paul O'Leary; Roland Ritt; Matthew Harker

doi:10.1109/I2MTC.2017.7969830

MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing

Roland Schmidt, Paul O'Leary, Roland Ritt, Matthew Harker

Chair of Automation and Measurement (530)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Original language	English
Title of host publication	I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
Publisher	Institute of Electrical and Electronics Engineers
ISBN (Electronic)	9781509035960
DOIs	https://doi.org/10.1109/I2MTC.2017.7969830
Publication status	Published - 5 Jul 2017
Event	2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017 - Politecnico di Turino, Torino, Italy Duration: 22 May 2017 → 25 May 2017 http://2017.imtc.ieee-ims.org/

Conference

Conference	2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017
Abbreviated title	I2MTC
Country/Territory	Italy
City	Torino
Period	22/05/17 → 25/05/17
Internet address	http://2017.imtc.ieee-ims.org/

Access to Document

10.1109/I2MTC.2017.7969830

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Schmidt, R., O'Leary, P., Ritt, R., & Harker, M. (2017). MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings Article 7969830 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/I2MTC.2017.7969830

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title = "MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing",

author = "Roland Schmidt and Paul O'Leary and Roland Ritt and Matthew Harker",

year = "2017",

month = jul,

day = "5",

doi = "10.1109/I2MTC.2017.7969830",

language = "English",

booktitle = "I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017 ; Conference date: 22-05-2017 Through 25-05-2017",

url = "http://2017.imtc.ieee-ims.org/",

}

Schmidt, R, O'Leary, P, Ritt, R & Harker, M 2017, MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing. in I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings., 7969830, Institute of Electrical and Electronics Engineers, 2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, 22/05/17. https://doi.org/10.1109/I2MTC.2017.7969830

MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing. / Schmidt, Roland; O'Leary, Paul; Ritt, Roland et al.
I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings. Institute of Electrical and Electronics Engineers, 2017. 7969830.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing

T2 - 2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017

AU - Schmidt, Roland

AU - O'Leary, Paul

AU - Ritt, Roland

AU - Harker, Matthew

PY - 2017/7/5

Y1 - 2017/7/5

UR - http://www.scopus.com/inward/record.url?scp=85026758874&partnerID=8YFLogxK

U2 - 10.1109/I2MTC.2017.7969830

DO - 10.1109/I2MTC.2017.7969830

M3 - Conference contribution

AN - SCOPUS:85026758874

BT - I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings

PB - Institute of Electrical and Electronics Engineers

Y2 - 22 May 2017 through 25 May 2017

ER -

Schmidt R, O'Leary P, Ritt R, Harker M. MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings. Institute of Electrical and Electronics Engineers. 2017. 7969830 doi: 10.1109/I2MTC.2017.7969830

MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing

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I²MTC

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MEMS Based Inclinometers: Noise Characteristics and Suitable Signal Processing: Noise characteristics and suitable signal processing

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I²MTC

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