Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

N. Vaxelaire; H. Proudhon; S. Labat; Christoph Kirchlechner; Jozef Keckes; V. Jaques; S. Ravy; S. Forest; O. Thomas

Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

N. Vaxelaire
, H. Proudhon
, S. Labat
, Christoph Kirchlechner
, Jozef Keckes
, V. Jaques
, S. Ravy
, S. Forest
, O. Thomas

Chair of Materials Physics (430)

Research output: Contribution to journal › Article › Research › peer-review

21 Citations (Scopus)

Translated title of the contribution	Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction
Original language	English
Pages (from-to)	1-12
Journal	New journal of physics
Publication status	Published - 2010

Cite this

@article{bf615004b49d4aeab13d6d05f7e74948,

title = "Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction",

author = "N. Vaxelaire and H. Proudhon and S. Labat and Christoph Kirchlechner and Jozef Keckes and V. Jaques and S. Ravy and S. Forest and O. Thomas",

year = "2010",

language = "English",

pages = "1--12",

journal = "New journal of physics",

issn = "1367-2630",

publisher = "IOP Publishing Ltd.",

}

TY - JOUR

T1 - Methodology for studying strain inhomogeneities in polycrystalline thin films during in situ thermal loading using coherent x-ray diffraction

AU - Vaxelaire, N.

AU - Proudhon, H.

AU - Labat, S.

AU - Kirchlechner, Christoph

AU - Keckes, Jozef

AU - Jaques, V.

AU - Ravy, S.

AU - Forest, S.

AU - Thomas, O.

PY - 2010

Y1 - 2010

M3 - Article

SN - 1367-2630

SP - 1

EP - 12

JO - New journal of physics

JF - New journal of physics

ER -