Microstructural characterization of deformed volume beneath microindentations using FIB, EBSD and TEM

Christian Motz, Daniel Kiener, H. Kreuzer, Werner Prantl, Reinhard Pippan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Translated title of the contribution	Microstructural characterization of deformed volume beneath microindentations using FIB, EBSD and TEM
Original language	English
Title of host publication	Proceedings of the 25th Risø International Symposium on Materials Science: Evolution of Deformation Microstructures in 3D
Pages	459-464
Publication status	Published - 2004

Cite this

@inproceedings{c5d9abb93b484bd2b9dd044ee0f45296,

title = "Microstructural characterization of deformed volume beneath microindentations using FIB, EBSD and TEM",

author = "Christian Motz and Daniel Kiener and H. Kreuzer and Werner Prantl and Reinhard Pippan",

year = "2004",

language = "English",

pages = "459--464",

booktitle = "Proceedings of the 25th Ris{\o} International Symposium on Materials Science: Evolution of Deformation Microstructures in 3D",

}

Microstructural characterization of deformed volume beneath microindentations using FIB, EBSD and TEM. / Motz, Christian; Kiener, Daniel; Kreuzer, H. et al.
Proceedings of the 25th Risø International Symposium on Materials Science: Evolution of Deformation Microstructures in 3D. 2004. p. 459-464.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Microstructural characterization of deformed volume beneath microindentations using FIB, EBSD and TEM

AU - Motz, Christian

AU - Kiener, Daniel

AU - Kreuzer, H.

AU - Prantl, Werner

AU - Pippan, Reinhard

PY - 2004

Y1 - 2004

M3 - Conference contribution

SP - 459

EP - 464

BT - Proceedings of the 25th Risø International Symposium on Materials Science: Evolution of Deformation Microstructures in 3D

ER -