Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings
Original language	English
Publication status	Published - 2011
Event	Size and Strain VI - Diffraction Analysis of the Microstructure of Materials - Hyères, France Duration: 16 Oct 2011 → …

Conference	Size and Strain VI - Diffraction Analysis of the Microstructure of Materials
Country/Territory	France
City	Hyères
Period	16/10/11 → …

Cite this

@conference{6e381709e0e94880beef4fb379231cc3,

title = "Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings",

author = "M. Bartosik and Rostislav Daniel and Christian Mitterer and S. Schoeder and M. Burghammer and Jozef Keckes",

year = "2011",

language = "English",

note = "Size and Strain VI - Diffraction Analysis of the Microstructure of Materials ; Conference date: 16-10-2011",

}

Research output: Contribution to conference › Poster › Research › peer-review

TY - CONF

T1 - Nano-Beam X-ray Diffraction as a Tool to Characterize Gradients of Microstructure and Residual Stress in Nanocrystalline Hard Coatings

AU - Bartosik, M.

AU - Daniel, Rostislav

AU - Mitterer, Christian

AU - Schoeder, S.

AU - Burghammer, M.

AU - Keckes, Jozef

PY - 2011

Y1 - 2011

M3 - Poster

T2 - Size and Strain VI - Diffraction Analysis of the Microstructure of Materials

Y2 - 16 October 2011

ER -