Translated title of the contribution | Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films |
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Original language | English |
Publication status | Published - 2010 |
Event | Applications of X-ray Analysis - Denver, United States Duration: 2 Oct 2010 → 6 Oct 2010 |
Conference
Conference | Applications of X-ray Analysis |
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Country/Territory | United States |
City | Denver |
Period | 2/10/10 → 6/10/10 |