Nano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films

Jozef Keckes, Matthias Bartosik, Rostislav Daniel, Christian Mitterer, G. Maier, S Schoeder, M. Burghammer

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionNano-Beam X-ray Diffraction Reveals Structural and Mechanical Gradients in Nano-Crystalline Thin Films
Original languageEnglish
Publication statusPublished - 2010
EventApplications of X-ray Analysis - Denver, United States
Duration: 2 Oct 20106 Oct 2010

Conference

ConferenceApplications of X-ray Analysis
Country/TerritoryUnited States
CityDenver
Period2/10/106/10/10

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