Nano-scale characterization of high-k dielectric materials by conducting atomic force microscopy

  • Sascha Kremmer
  • , Harald Wurmbauer
  • , Andrei Andreev
  • , Christian Teichert
  • , G. Tallarida
  • , S. Spiga
  • , C. Wiemer
  • , M. Fanciulli

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionNano-scale characterization of high-k dielectric materials by conducting atomic force microscopy
Original languageEnglish
Publication statusPublished - 2006
Event14th International Winterschool on New Developments in Solid State Physics - Mauterndorf, Austria
Duration: 13 Feb 200617 Feb 2006

Conference

Conference14th International Winterschool on New Developments in Solid State Physics
Country/TerritoryAustria
CityMauterndorf
Period13/02/0617/02/06

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