Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

Research output: Contribution to journal › Article › Research › peer-review

5 Citations (Scopus)

Translated title of the contribution	Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
Original language	English
Pages (from-to)	C5G5-C5G10
Journal	Journal of vacuum science & technology / B (JVST)
Volume	28
DOIs	https://doi.org/10.1116/1.3454373
Publication status	Published - 2010

Access to Document

@article{d18e2a16e7cb4e309b1c8c58ed735e41,

title = "Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge",

author = "Igor Beinik and B. Galiana and Markus Kratzer and Christian Teichert and I. Rey-Stolle and C. Algora and Paloma Tejedor",

year = "2010",

doi = "10.1116/1.3454373",

language = "English",

volume = "28",

pages = "C5G5--C5G10",

journal = "Journal of vacuum science \& technology / B (JVST)",

issn = "0734-211X",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge

AU - Beinik, Igor

AU - Galiana, B.

AU - Kratzer, Markus

AU - Teichert, Christian

AU - Rey-Stolle, I.

AU - Algora, C.

AU - Tejedor, Paloma

PY - 2010

Y1 - 2010

U2 - 10.1116/1.3454373

DO - 10.1116/1.3454373

M3 - Article

SN - 0734-211X

VL - 28

SP - C5G5-C5G10

JO - Journal of vacuum science & technology / B (JVST)

JF - Journal of vacuum science & technology / B (JVST)

ER -