Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis

G. Brauer, W. Anwand, D. Grambole, W. Skorupa, Yue Hou, Andrei Andreev, Christian Teichert, K. H. Tam, A. B. Djurisic

Research output: Contribution to journalArticleResearchpeer-review

25 Citations (Scopus)
Translated title of the contributionNon-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
Original languageEnglish
Pages (from-to)195301-1-195301-8
JournalNanotechnology
Volume18
DOIs
Publication statusPublished - 2007

Cite this