Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy

Quan Shen, Andreas Pavitschitz, Gregor Hlawacek, Christian Teichert, Matthias Edler, Simone Radl, Thomas Grießer, Alexandra Lex, Thomas Höfler, Georg Trimmel, Wolfgang Kern

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionPatterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy
Original languageEnglish
Publication statusPublished - 2011
EventMRS Spring Meeting April 25-29 2011 San Francisco - San Francisco, United States
Duration: 25 Apr 201129 Apr 2011

Conference

ConferenceMRS Spring Meeting April 25-29 2011 San Francisco
Country/TerritoryUnited States
CitySan Francisco
Period25/04/1129/04/11

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